Quantum Optical Technologies for Metrology, Sensing and Imaging

Topic: 
Quantum Optical Technologies for Metrology, Sensing and Imaging
Date & Time: 
Monday, November 21, 2016 -
14:30 to 15:30
Speaker: 
Jonathan P. Dowling, Louisiana State University
Location: 
Room 264, Geography Building, 3663 Zhongshan Road North, Shanghai

Over the past 20 years, bright sources of entangled photons have led to a renaissance in quantum optical interferometry. Optical interferometry has been used to test the foundations of quantum mechanics and implement some of the novel ideas associated with quantum entanglement such as quantum teleportation, quantum cryptography, quantum lithography, quantum computing logic gates, and quantum metrology. In this talk, we focus on the new ways that have been developed to exploit quantum optical entanglement in quantum metrology to beat the shot-noise limit, which can be used, e.g., in fiber optical gyroscopes and in sensors for biological or chemical targets. We also discuss how this entanglement can be used to beat the Rayleigh diffraction limit in imaging systems such as in LIDAR, RADAR, and optical lithography and microscopy.

Biography
Jonathan P. Dowling is the Hearne Chair Professor of Theoretical Physics and Co-Director of the Hearne Institute for Theoretical Physics, Department of Physics and Astronomy, Louisiana State University, Baton Rouge, Louisiana. Dowling has over 130 published articles, and he holds eight US patents in the fields of quantum technologies. He is a Fellow of the American Association for the Advancement of Science, a Fellow of the American Physical Society, a Fellow of the Institute of Physics, and a Fellow of Optical Society of America. He has been awarded the Willis E. Lamb Medal for Laser Science and Quantum Optics, the US Army Research and Development Achievement Award, the NASA Space Act Award, and was runner up for the Discover Magazine Technology of the Year Award.

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Location & Details: 

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